Electron Energy-Loss Spectroscopy in the Electron Microscope

You looking to find the "Electron Energy-Loss Spectroscopy in the Electron Microscope" Good news! You can purchase Electron Energy-Loss Spectroscopy in the Electron Microscope with secure price and compare to view update price on this product. And deals on this product is available only for limited time.

   

Product Description

Within the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard analytical technique used in the transmission electron microscope to extract chemical and structural information down to the atomic level. �In two previous editions, Electron Energy-Loss Spectroscopy in the Electron Microscope has become the standard reference guide to the instrumentation, physics and procedures involved, and the kind of results obtainable. Within the last few years, the commercial availability of lens-aberration correctors and electron-beam monochromators has further increased the spatial and energy resolution of EELS. This thoroughly updated and revised Third Edition incorporates these new developments, as well as advances in electron-scattering theory, spectral and image processing, and recent applications in fields such as nanotechnology. The appendices now contain a listing of inelastic mean free paths and a description of more than 20 MATLAB programs for calculating EELS data.

</p>

Electron Energy-Loss Spectroscopy in the Electron Microscope Review

For as long as I can remember, Ray Egerton has been at the forefront of electron energy loss spectroscopy (EELS) in the transmission electron microscope (TEM). For those who want to find out more about EELS and its ability to map composition at a nanometer scale (especially for low Z elements), this book is probably the best place to start. In addition to describing such instrumentation as magnetic prisms and lenses, the author provides a review of elastic and inelastic scattering theory. Inelastic scattering, as the key to understanding EELS, and the source of the features in the EELS spectrum, is broken down into plasmons (both bulk and surface) and the characteristic atomic excitations that lead to absorption edges. Bethe's theory of energy loss from characteristic atomic excitations is laid out in sufficient detail, as is the formulation of EELS spectra in terms of the complex dielectric constant. Inelastic scattering theory is, in turn, used by the author to calculate the spatial resolution of this technique as a function of the incident electron energy and the electron energy loss.

If you want to get a taste of what this book is like, I would suggest that you read Egerton's review article in Rep. Prog. Phys. 72 (2009) 016502 as well as his article in Ultramicroscopy 4 (1979) 169.

Most of the consumer Reviews tell that the "Electron Energy-Loss Spectroscopy in the Electron Microscope" are high quality item. You can read each testimony from consumers to find out cons and pros from Electron Energy-Loss Spectroscopy in the Electron Microscope ...